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Elsevier Science B. V. |
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Bernabeu Martínez, Eusebio ; Sánchez Brea, Luis Miguel ; Siegmann, Philip ; Martínez Antón, Juan Carlos ; Gómez Pedrero, José Antonio ; Wilkening, Günter ; Koenders, Ludger ; Müller, Franz ; Hildebrand, M. ; Hermann, Harti | Elsevier Science B. V. | 2001-08-16In this report a classification of the main surface structures found on fine metallic wires is carried out (between ?20 and 500 ?m in diameter). For this, we have analyzed a series of wires of different metallic materials, diameters and producti[...]texto impreso
Siegmann, Philip ; Sánchez Brea, Luis Miguel ; Martínez Antón, Juan Carlos ; Bernabeu Martínez, Eusebio | Elsevier Science B. V. | 2004-11-15Conventional microscopy techniques, such as atomic force microscopy (AFM), scanning electron microscopy (SEM), and confocal microscopy (CM) are not suitable for on-line surface inspection of fine metallic wires. In the recent years, some optical[...]texto impreso
Peral Cerdá, Assumpta ; Alonso Fernández, José ; Canos Sanz, Joán ; Bernabeu Martínez, Eusebio | Elsevier Science B. V. | 2000-11The warpage of a set of six hard resin spherical lenses was measured when they were compressed by means of the tangential force exerted by a metal frame. The technique employed to measure the lenses improves over previous work both because great[...]texto impreso
Prieto, Pilar ; Marco, F. ; Prieto, José E. ; Ruiz Gómez, Sandra ; Pérez García, Lucas ; Perez del Real, Rafael ; Velazquez, Manuel ; De laFiguera, Juan | Elsevier Science B. V. | 2018-04-01Epitaxial cobalt ferrite thin films with strong in-plane magnetic anisotropy have been grown on Si (001) substrates using a TiN buffer layer. The epitaxial films have been grown by ion beam sputtering using either metallic, CoFe?, or ceramic, Co[...]texto impreso
San Blas, A. ; Martínez Calderón, M. ; Buencuerpo Fariña, Jerónimo ; Sánchez Brea, Luis Miguel ; Hoyo, J. del ; Gómez Aranzadi, M. ; Rodriguez, A. ; Olaizola, S.M. | Elsevier Science B. V. | 2020-08-01A fast and reliable method for the fabrication of polarization modifying devices using femtosecond laser is reported. A setup based on line focusing is used for the generation of LIPSS on stainless steel, processing at different speeds between 0[...]texto impreso
Quiroga Mellado, Juan Antonio ; Vargas, Javier ; Restrepo, R. ; Belenguer Dávila, Tomás | Elsevier Science B. V. | 2011-08-15We demonstrate a method to easily and quickly extend the dynamic range imaging capabilities of the camera in a typical interferometric approach. The camera dynamic range is usually low and limited to 256 gray levels. Also, it is well known that [...]texto impreso
Quiroga Mellado, Juan Antonio ; Martínez Antón, Juan Carlos ; González Moreno, Ricardo | Elsevier Science B. V. | 2004-11-15In this work we present an optical tool for characterizing the reflectance and polarimetric properties of surfaces. It uses only the image of the interference fringe pattern produced in a thin air-gap between the surface of interest and a glass [...]