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Mártil de la Plaza, Ignacio ; González Díaz, Germán ; Prado Millán, Álvaro del ; San Andres Serrano, Enrique | Pergamon-Elsevier Science Ltd. | 2002-09-26Silicon oxynitride films covering the whole composition range from silicon nitride to silicon oxide have been deposited by electron cyclotron resonance chemical vapor deposition from SiH4, O-2 and N-2 gas mixtures. The composition of the films h[...]texto impreso
Water uptakes properties and effective fixed charge concentration have been determined in aqueous electrolyte solutions (LiCl, NaCl and KCl) for different commercial sulfonated polymer cation-exchange membranes with different morphology. Differe[...]texto impreso
In 1757, Leonhard Euler started the study of the tallest column, i.e. the shape of a stable column with the symmetry of revolution, such that it attains the maximum height once the total mass is prescribed, buckling due to the effect of a load s[...]texto impreso
Sánchez de Miguel, Alejandro ; Zamorano Calvo, Jaime ; Gómez Castaño, José ; Pascual Ramírez, Sergio | Pergamon-Elsevier Science Ltd. | 2014-05We present the results of the analysis of satellite imagery to study light pollution in Spain. Both calibrated and non-calibrated DMSP-OLS images were used. We describe the method to scale the non-calibrated DMSP-OLS images which allows us to us[...]texto impreso
Díaz Díaz, Jesús Ildefonso ; Muñoz Montalvo, Ana Isabel ; Schiavi, Emanuele | Pergamon-Elsevier Science Ltd. | 2007-02This paper deals with the mathematical analysis of a nonlinear system of three differential equations of mixed type. It describes the generation of fast ice streams in ice sheets flowing along soft and deformable beds. The system involves a nonl[...]texto impreso
In this article, we study the influences of the rapid thermal annealing temperature and dielectric composition on the electrical characteristics of ECR-deposited silicon nitride SiNx:H-InP and SiNx:H-InGaAs interfaces. C-V deep level transient s[...]texto impreso
Cleaning of InP surfaces using electron cyclotron resonance (ECR) nitrogen plasmas has been studied. Electrical performance of Al/SiNx:H/InP structures has been analysed to determine the effect of the plasma cleaning. The SINx:H insulator layers[...]texto impreso
Mártil de la Plaza, Ignacio ; González Díaz, Germán ; San Andres Serrano, Enrique | Pergamon-Elsevier Science Ltd. | 2005-05We investigate the influence of the used cleaning method and rapid thermal annealing (RTA) conditions on the electrical characteristics of MIS devices based on SiNy:H/SiOx dielectric stack structures fabricated by electron-cyclotron-resonance pl[...]texto impreso
Mártil de la Plaza, Ignacio ; González Díaz, Germán ; Prado Millán, Álvaro del ; San Andres Serrano, Enrique | Pergamon-Elsevier Science Ltd. | 2002-09-26The composition (x = [O]/[Si]), hydrogen content, bonding configuration and paramagnetic defects of SiOx films were studied. Films were deposited by the electron cyclotron resonance plasma method at room temperature using SiH4 and O-2 as precurs[...]texto impreso
Mártil de la Plaza, Ignacio ; González Díaz, Germán ; Prado Millán, Álvaro del ; San Andres Serrano, Enrique | Pergamon-Elsevier Science Ltd. | 2002-09-26The bonding configuration, hydrogen evolution and defect content of rapid thermally annealed (RTA) SiOx:H films of different initial compositions were studied. Infrared absorption measurements showed that all the hydrogen present in the films wa[...]texto impreso
Prados Díaz, Alicia ; Ranchal Sánchez, Rocío ; Pérez García, Lucas | Pergamon-Elsevier Science Ltd. | 2015-08-20Bismuth ultra-thin films grown on n-GaAs electrodes via electrodeposition are porous due to a blockade of the electrode surface caused by adsorbed hydrogen when using acidic electrolytes. In this study, we discuss the existence of two sources of[...]
