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Quiroga Mellado, Juan Antonio ; Crespo Vázquez, Daniel ; Fournier, N. ; Martínez Antón, Juan Carlos | VDI-VDE - Verlag GMBH | 2004Automatic demodulation of single-image fringe patterns is of great importance in research areas were it is difficult to apply standard phase evaluation techniques such as phase sampling or Fourier transform methods. In this work we will present [...]texto impreso
Quiroga Mellado, Juan Antonio ; González Moreno, Ricardo ; Alonso Fernández, José ; Bernabeu Martínez, Eusebio | VDI-VDE - Verlag GMBH | 2004CCD-based setups are widely extended in commercial beam profilers. In many beam-profiling applications the high sensitivity of CCD-camera makes necessary the attenuation of the beam. It can affect the beam profile and cause lost of information i[...]
