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Rico-García, José María ; Sánchez Brea, Luis Miguel ; Alda, Javier | The Optical Society Of America | 2008-02-20A tomographiclike method based on the inverse radon transform is used to retrieve the irradiance map of a focused laser beam. The results obtained from multiple knife-edge measurements have been processed through a kriging technique. This techni[...]texto impreso
We analyze the far-field intensity distribution of binary phase gratings whose strips present certain randomness in their height. A statistical analysis based on the mutual coherence function is done in the plane just after the grating. Then, th[...]texto impreso
Bernabeu Martínez, Eusebio ; Sánchez Brea, Luis Miguel ; Siegmann, Philip ; Martínez Antón, Juan Carlos ; Gómez Pedrero, José Antonio ; Wilkening, Günter ; Koenders, Ludger ; Müller, Franz ; Hildebrand, M. ; Hermann, Harti | Elsevier Science B. V. | 2001-08-16In this report a classification of the main surface structures found on fine metallic wires is carried out (between ?20 and 500 ?m in diameter). For this, we have analyzed a series of wires of different metallic materials, diameters and producti[...]texto impreso
Sánchez Brea, Luis Miguel ; Torcal Milla, Francisco José ; Salgado Remacha, Francisco Javier ; Morlanes Calvo, Tomás ; Jiménez Castillo, Isidoro ; Bernabeu Martínez, Eusebio | The Optical Society Of America | 2010-06-10We present a collimation technique based on a double grating system to locate with high accuracy an emitter in the focal plane of a lens. Talbot self-images are projected onto the second grating producing moiré interferences. By means of two pho[...]texto impreso
Highly collimated beams are required in numerous applications and techniques. Different methods have been proposed for collimating monochromatic point light sources during the recent years. In this work, we analyze how a finite size and polychro[...]texto impreso
Siegmann, Philip ; Sánchez Brea, Luis Miguel ; Martínez Antón, Juan Carlos ; Bernabeu Martínez, Eusebio | Elsevier Science B. V. | 2004-11-15Conventional microscopy techniques, such as atomic force microscopy (AFM), scanning electron microscopy (SEM), and confocal microscopy (CM) are not suitable for on-line surface inspection of fine metallic wires. In the recent years, some optical[...]texto impreso
Sánchez Brea, Luis Miguel ; Torcal Milla, Francisco José ; Bernabeu Martínez, Eusebio | The Optical Society Of America | 2009-10-20We analyze the Talbot effect produced by a mask composed of two diffraction gratings. Combinations with phase and amplitude gratings have been studied in the near-field regime. For a two-phase-gratings configuration, the Talbot effect is cancele[...]texto impreso
Saez Landete, José ; Alonso Fernández, José ; Sánchez Brea, Luis Miguel ; Morlanes Calvo, Tomás ; Bernabeu Martínez, Eusebio | Optical Society of America | 2009-09-01Two-grating measurement systems are routinely employed for high-resolution measurements of angular and linear displacement. Usually, these systems incorporate zero reference codes (ZRCs) to obtain a zero reference signal (ZRS), which is used as [...]texto impreso
Herrera Fenández, José María ; Vilas, José Luis ; Sánchez Brea, Luis Miguel ; Bernabeu Martínez, Eusebio | Optical Society of America | 2015-11-20A superachromatic quarter-wave retarder using an arbitrary number of waveplates in a broadband spectral range has been proposed. Their design is based on the optimization of a merit function, the achromatism degree (AcD), which represents a glob[...]texto impreso
Tejeda, César ; Sánchez Brea, Luis Miguel ; Bernabeu Martínez, Eusebio | The Optical Society Of America | 2004-03-01We propose a model for determining the far-field diffraction pattern of wires with waviness. Analytical solutions are obtained by means of the stationary phase method, which allows us to determine dimensional parameters such as wire diameter and[...]texto impreso
Sánchez Brea, Luis Miguel ; Bernabeu Martínez, Eusebio | The Optical Society Of America | 2005-06-01In optical metrology the final experimental result is normally an image acquired with a CCD camera. Owing to the sampling at the image, an interpolation is usually required. For determining the error in the measured parameters with that image, k[...]texto impreso
In this paper we present a model to determine the light scattered by a metallic cylinder when it is illuminated with a light beam in oblique incidence. This model is based on an approximate solution to the Helmholtz-Kirchhoff integral by means o[...]texto impreso
In this work, we obtain analytical expressions for the near-and far-field diffraction of random Ronchi diffraction gratings where the slits of the grating are randomly displaced around their periodical positions. We theoretically show that the e[...]texto impreso
Siegmann, Philip ; Sánchez Brea, Luis Miguel ; Martínez Antón, Juan Carlos ; Bernabeu Martínez, Eusebio | Gustav Fischer Verlag | 2002We present an analytical model to obtain the diffraction pattern in far field of a metallic, thick slit based on the Geometrical Theory of Diffraction. The edges of the slit are modelled as semicylinders. We have considered that the thickness of[...]texto impreso
Torcal Milla, Francisco José ; Sánchez Brea, Luis Miguel ; Bernabeu Martínez, Eusebio | The Optical Society Of America | 2008-11-24We analyze the far field and near field diffraction pattern produced by an amplitude grating whose strips present rough edges. Due to the stochastic nature of the edges a statistical approach is performed. The grating with rough edges is not pur[...]
