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Urbieta Quiroga, Ana Irene ; Fernández Sánchez, Paloma ; Piqueras de Noriega, Javier ; Vasco, E. ; Zaldo, C. | natl Inst Optoelectronics | 2004-03Scanning tunnelling microscopy and spectroscopy have been used to characterize electrically active grain boundaries in pulsed laser deposited ZnO films with grain sizes in the range 216-500 nm. The p-type behaviour at the boundary is evidenced b[...]texto impreso
Urbieta, S. ; Fernández Sánchez, Paloma ; Piqueras de Noriega, Javier ; Vasco, E. ; Zaldo, C | Wiley-V C H Verlag Gmbh | 2003-01Highly (001) textured ZnO films grown on (100)InP by pulsed laser deposition have been studied by Scanning Tunneling Microscopy (STM). Constant current images show a well defined grain structure, which allows to perform local spectroscopic studi[...]
