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Korkian, Golnaz ; Rahmanikia, Navid ; Noori, Hamid ; Clemente Barreira, Juan Antonio | 2017-03-18During the last decades, technology scaling in reconfigurable logic devices enabled implementing complicated designs which results in higher power density and on-chip temperature. Since higher operating temperature of chips is a critical problem[...]texto impreso
Franco Peláez, Francisco Javier ; Clemente Barreira, Juan Antonio ; Korkian, Golnaz ; Fabero Jiménez, Juan Carlos ; Mecha López, Hortensia ; Velazco, Raoul | IEEE-Inst Electrical Electronics Engineers Inc | 2020In radiation tests on SRAMs or FPGAs, two or more independent bitflips can be misled with a multiple event if they accidentally occur in neighbor cells. In the past, different tests such as the ``birthday statistics'' have been proposed to estim[...]texto impreso
Fabero Jiménez, Juan Carlos ; Mecha López, Hortensia ; Franco Peláez, Francisco Javier ; Clemente Barreira, Juan Antonio ; Korkian, Golnaz ; Rey, Solenne ; Cheymol, Benjamin ; Baylac, Maud ; Hubert, Guillaume ; Velazco, Raoul | IEEE-Inst Electrical Electronics Engineers Inc | 2020A sensitivity characterization of a Xilinx Artix-7 FPGA against 14.2 MeV neutrons is presented. The content of the internal SRAMs and flip-flops were downloaded in a PC and compared with a golden version of it. Flipped cells were identified and [...]
