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Álvarez Herrero, Alberto ; López Heredero, Raquel ; Levy, David ; Bernabeu Martínez, Eusebio | The Optical Society Of America | 2001-02-01The variation of the optical properties of porous Vycor glass (Corning, Model 7930) under different relative-humidity conditions was studied. The adsorption of water into the glass pores was investigated with spectroscopic ellipsometry. The chan[...]texto impreso
Álvarez Herrero, Alberto ; Guerrero Padrón, Héctor ; Levy, David ; Bernabeu Martínez, Eusebio | The Optical Society Of America | 2002-11-01An optical method to determine the nanostructure and the morphology of porous thin films is presented. This procedure is based on the response of a side-polished optical fiber with the film under study, when an adsorption-desorption cycle is car[...]texto impreso
La caracterización elipsométrica de recubrimientos de TiO2 depositados por evaporación ha permitido establecer una relación entre la nanoestructura porosa del material y sus propiedades ópticas. Asimismo, ha quedado demostrada la influencia de l[...]texto impreso
Rodriguez Schwendtner, Eva María ; Álvarez Herrero, Alberto ; Mariscal Jiménez, Antonio ; Serna Galán, Rosalía ; González Cano, Agustín ; Navarrete Fernández, María Cruz ; Díaz Herrera, Natalia | AVS Science and Technology Society; American Vacuum Society | 2019-11-01The authors present the results of the ellipsometric characterization of thin layers of bismuth and aluminum oxide deposited over the waist of a tapered optical fiber by pulsed laser deposition. The characteristics of the deposits are studied by[...]texto impreso
Quiroga Mellado, Juan Antonio ; Uribe Patarroyo, Néstor R. ; Vargas, Javier ; Álvarez Herrero, Alberto ; Belenguer Dávila, Tomás | The Optical Society Of America | 2010-02-01Liquid crystal variable retarders (LCVRs) are starting to be widely used in optical systems because of their capacity to provide a controlled variable optical retardance between two orthogonal components of incident polarized light or to introdu[...]texto impreso
Quiroga Mellado, Juan Antonio ; Vargas, Javier ; Álvarez Herrero, Alberto ; Belenguer Dávila, Tomás | The Optical Society Of America | 2011-01-17The presence of uncontrolled mechanical vibrations is typically the main precision-limiting factor of a phase-shifting interferometer. We present a method that instead of trying to insolate vibrations; it takes advantage of their presence to pro[...]texto impreso
Álvarez Herrero, Alberto ; Ramos Zapata, Gonzalo ; Monte Muñoz de la Peña, Francisco del ; Levy, David ; Bernabeu Martínez, Eusebio | Elsevier Science SA | 2004-05-01High refractive index TiO_2–SiO_2 thin films were prepared by the sol–gel method and the optical properties were characterized by spectroscopic ellipsometry. The results of the optical analysis were related with the TiO_2–SiO_2 molar ratio of th[...]
