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Herrera, M. ; Cremades Rodríguez, Ana Isabel ; Stutzmann, M. ; Piqueras de Noriega, Javier | Academic Press Ltd- Elsevier Science Ltd | 2009-04Mn doped GaN films have been studied by conductive Atomic Force Microscopy (AFM), Cathodoluminescence (CL) and Electron Beam Induced Current (EBIC). AFM measurements revealed the presence of pinholes with diameters between 130 and 380 nm. The di[...]texto impreso
Herrera, M. ; Cremades Rodríguez, Ana Isabel ; Stutzmann, M. ; Piqueras de Noriega, Javier | Academic Press Ltd- Elsevier Science Ltd | 2009-04Mn doped GaN films have been studied by conductive Atomic Force Microscopy (AFM), Cathodoluminescence (CL) and Electron Beam Induced Current (EBIC). AFM measurements revealed the presence of pinholes with diameters between 130 and 380 nm. The di[...]texto impreso
Herrera, M. ; Cremades Rodríguez, Ana Isabel ; Piqueras de Noriega, Javier ; Stutzmann, M. ; Ambacher, O. | American Institute of Physics | 2004-11Cathodoluminescence (CL) in the scanning electron microscope and atomic force microscopy (AFM) have been used to study the formation of pinholes in tensile and compressively strained AlInGaN films grown on Al2O3 substrates by plasma-induced mole[...]
