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Schmidt, Rainer ; Eerenstein, Wilma ; Winiecki, Thomas ; Morrison, Finlay D. | American Physical Society | 2007-06-14Temperature dependent impedance spectroscopy enables the many contributions to the dielectric and resistive properties of condensed matter to be deconvoluted and characterized separately. We have achieved this for multiferroic epitaxial thin fil[...]texto impreso
The dielectric properties of multiferroic BiMnO_(3) 50 nm epitaxial thin films grown on Nb-doped SrTiO_(3)(001) substrates were analyzed by impedance spectroscopy between 55 and 155 K. One single intrinsic thin film dielectric relaxation process[...]
