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Harris, V. G. ; Das,, B.N. ; Woicik, J. C. ; Crespo del Arco, Patricia ; Hemando, A. ; Garcia Escorial, A. | Editions Physique | 1997-04A least-square fitting analysis of EXAFS data collected from partially-crystallized Fe_80B_20 thin films (t=15 nm), using data collected from pure phase standards of the crystallization products, was found effective in determining the relative a[...]texto impreso
Kirkland, J. P. ; Woicik, J. C. ; Crespo del Arco, Patricia ; Hernando Grande, Antonio ; Garcia Escorial, A. | American Physical Society | 1996-08-01Extended x-ray-absorption fine-structure (EXAFS) measurements were used to obtain element- specific, structural, and chemical information of the local environments around Cu and Fe atoms in high-energy ballmilled Cu_Fe_(12-X) samples (x=0.50 and[...]
